TSW provides products and services to organizations that utilize optical scatterometry as a means to monitor and control manufacturing processes across a wide range of industries.  The semiconductor industry uses particle scanners (basically sophisticated scatterometers) to detect and identify surface features, such as particles, pits and roughness.  Scatterometers are also used to determine the surface roughness of computer disks used in storage media and to inspect key components in a variety of government and industry optical systems.  More recently scatterometry has been recognized as a key tool in the measurement of “appearance” for a huge variety of (hopefully) identical coated and painted metal and plastic products that are often produced over several years and even in different countries.

You may use the menu on the left to arrange for consulting, scatter measurements and NIST Traceable particle deposition standards on a variety of substrates.  In addition there are pages that provide technical information and contact to other members of the “scatter community” and friends.  The Industry Updates section contains recent articles and announcements related to scatterometry and optics in general.

We hope your visit will be enjoyable and informative.