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The founder of the company, Dr. John Stover, has been involved in light scatter measurements and analysis for most of his professional career. His book, Optical Scattering: Measurement and Analysis, is considered one of the basic texts on scatter metrology. John is active in developing international standards with SEMI and has worked closely with NIST and International SEMATECH to improve measurement and analysis of scatter signals from roughness, small defects and particles. Scatter measurements taken for TSW customers are used to support the design of optical systems, flat panel displays, semiconductor defect detection, production control equipment, medical instrumentation and a variety of other applications. John has the industry contacts necessary to bring together the right set of people and skills necessary to address virtually any light scatter issue. In addition TSW has a close symbiotic relationship with three other small optical companies in Commerce Park and is connected with a number of additional key players in Tucson's “Optics Valley” community. System proto-typing, electronic design, computer control and lens design are all skills that can be brought to bear by TSW on your problem when necessary. Because of this local concentration of optical education, experience and talent, TSW can offer capabilities that many larger companies have difficulty duplicating. So whether your problems involve surface roughness, defects, scatter from films or contamination, give TSW a chance to help you solve them. |