TSW’s products and services are all related to light scatter measurement and analysis. TSW has one of the few labs in the country offering Scatter Measurements (sometimes called BRDF measurements).

The founder of the company, John Stover, has been working in light scatter metrology for over three decades and helps companies in a variety of industries solve scatter related problems through our Consulting Service.

In addition, companies may arrange for an in-house Tutorial or rely on Stover’s Book or Video course available through SPIE.

Particle Depositions are used as scatter standards in the semiconductor and disk industries and TSW provides NIST Traceable depositions.

More recently TSW has become involved in a venture to produce products that measure, or monitor, surface appearance.

ScatterMaster^TM is a software program used to analyze scatter patterns and ScatterScope^TM is an instrument that measures surface scatter in a large cone around the reflected specular beam. Combined measurement and analysis is fast – less than one second.

All of these products and services are described in more detail on on the following pages and may be accessed from the main menu or by clicking above on the hyper links.